Overlay key with a plurality of crossings and method of...

Details Overlay key with a plurality of crossings and method of... Overlay key with a plurality of crossings and method of...

2007-06-26

2007-06-26

Toatley, Jr., Gregory J. (Department: 2886)

Optics: measuring and testing

By alignment in lateral direction

With registration indicia

Reexamination Certificate

active

10881201

ABSTRACT:
An overlay key includes a main scale and a vernier scale, which traverse each other forming a plurality of crossings. The main scale includes a first main sub-scale and a second main sub-scale, which are separated from each other or at least partially overlap each other. The first and second main sub-scales extend in different directions such that they are not parallel to each other. The vernier scale includes a first vernier sub-scale and a second vernier sub-scale, which are separated from each other or at least partially overlap each other. The first and second vernier sub-scales extend in different directions such that they are not parallel to each other. Two measured crossings are obtained when the main scale and the vernier scale cross each other in a measured position. Then, overlay accuracy is measured from coordinate differences between reference crossings and the measured crossings.

REFERENCES:
patent: 5083378 (1992-01-01), Juday
patent: 5757507 (1998-05-01), Ausschnitt et al.
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patent: 6063531 (2000-05-01), Singh et al.
patent: 6710876 (2004-03-01), Nikoonahad et al.
patent: 6897956 (2005-05-01), Noguchi et al.
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patent: 1998-052319 (1998-09-01), None
English language abstract of Korean Publication No. 1998-052319.

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