Overheat detection in thermally controlled devices

Details Overheat detection in thermally controlled devices Overheat detection in thermally controlled devices

2004-08-06

2010-02-02

Fleming, Fritz M. (Department: 2836)

Electricity: electrical systems and devices

Safety and protection of systems and devices

Circuit interruption by thermal sensing

C702S132000

Reexamination Certificate

active

07656635

ABSTRACT:
Systems and methods of overheat detection provide for generating a control signal on a die containing a processor based on an internal temperature of the processor and a control temperature threshold. It can be determined whether to generate a warning temperature event on the die based on a behavior of the control signal. In one embodiment, the warning temperature event provides for initiation of an automated data saving process, which reduces the abruptness of conventional warning temperature shutdowns. Other embodiments provide the user the option of saving his or her work before a shutdown temperature threshold is reached.

REFERENCES:
patent: 4567466 (1986-01-01), Bozarth et al.
patent: 5422806 (1995-06-01), Chen et al.
patent: 5550702 (1996-08-01), Schmidt et al.
patent: 6098030 (2000-08-01), McMinn
patent: 6774653 (2004-08-01), Gold et al.
patent: 6975047 (2005-12-01), Pippin
patent: 6996491 (2006-02-01), Gold et al.
patent: 7096145 (2006-08-01), Orenstien et al.
patent: 7141953 (2006-11-01), Cohen
patent: 7185500 (2007-03-01), Meir
patent: 7275012 (2007-09-01), Hermerding, II
patent: 2002/0101715 (2002-08-01), Osecky et al.
patent: 2003/0158697 (2003-08-01), Gold et al.
patent: 2004/0047099 (2004-03-01), Pippin
patent: 10062441 (2002-03-01), None
Kevin Skadron, et al., “Temperature-Aware Microarchitecture,” Published in the Proceedings of the 30thInternational Symposium on Computer Architecture, Jun. 9-11, 2003 in San Diego, CA, pp. 1-12.
Kevin Skadron, et al., “Control-Theoretic Techniques and Thermal-RC Modeling for Accurate and Localized Dynamic Thermal Management,” Published in the Proceedings of the Eighth International Symposium on High-Performance Computer Architecture, Feb. 2-6, 2002 in Cambridge, MA, pp. 1-12.
Intel SpeedStep® Technology Backgrounder, Mobile Pentium®///Processors Featuring Intel® Speedstep™ Technology-Desktop-Class Performance and Low Power for Longer Battery Life, pp. 1-3. http://www.intel.com/mobile/resources/downloads/pdf/Intel—Speedstep.pdf, downloaded on website Oct. 26, 2004.
Cohen, et al., entitled, “Methods and Apparatus for Optimal Voltage and Frequency Control of Thermally Limited Systems”, U.S. Appl. No. 11/459,407, filed Jul. 24, 2006.

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