Overheat detecting circuit

Miscellaneous active electrical nonlinear devices – circuits – and – External effect – Temperature

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C374S163000, C374S170000, C374S178000

Reexamination Certificate

active

07417487

ABSTRACT:
An overheat detecting circuit according to an embodiment of the invention includes: a current source for generating a constant current; an overheat detecting element unit that operates with a first current generated in accordance with the constant current and generates a first voltage based on a semiconductor substrate temperature; and a detecting circuit unit that operates a second current generated in accordance with the constant current, and generates a second voltage corresponding to a predetermined semiconductor substrate temperature to detect overheating based on a voltage difference between the first voltage and a reference voltage and a voltage difference between the second voltage and the reference voltage.

REFERENCES:
patent: 5095227 (1992-03-01), Jeong
patent: 5444219 (1995-08-01), Kelly
patent: 7350974 (2008-04-01), Mikuni et al.
patent: 2005/0041353 (2005-02-01), Finney
patent: 2006/0056486 (2006-03-01), Mikuni et al.
patent: 2006/0232313 (2006-10-01), Favard
patent: 6-169222 (1994-06-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Overheat detecting circuit does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Overheat detecting circuit, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Overheat detecting circuit will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3996315

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.