Over-under double-pass interferometer

Optics: measuring and testing – By particle light scattering – With photocell detection

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G01B 902

Patent

active

041814401

ABSTRACT:
An over-under double-pass interferometer in which the beamsplitter area and thickness can be reduced to conform only with optical flatness considerations is achieved by offsetting the optical center line of one cat's-eye retroreflector relative to the optical center line of the other in order that one split beam be folded into a plane distinct from the other folded split beam. The beamsplitter is made transparent in one area for a first folded beam to be passed to a mirror for doubling back and is made totally reflective in another area for the second folded beam to be reflected to a mirror for doubling back. The two beams thus doubled back are combined in the central, beam-splitting area of the beamsplitter and passed to a detector. This makes the beamsplitter insensitive to minimum-thickness requirements and selection of material.

REFERENCES:
patent: 3809481 (1974-05-01), Schindler
patent: 3976379 (1976-08-01), Morokuma

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