Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
Reexamination Certificate
2007-08-17
2011-11-08
Charioui, Mohamed (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system
Temperature measuring system
Reexamination Certificate
active
08055468
ABSTRACT:
An electronic instrument having in its circuitry a specific solid state switch that exhibits detrimental current leakage at elevated temperatures, a variable voltage device in the instrument connected to the specific switch, the variable voltage device being capable, at an experimentally determined voltage setting, of zeroing out the leakage current in the specific switch, the variable voltage device being set at a voltage setting determined experimentally using said specific switch at an elevated temperature thereby temperature compensating said specific switch.
REFERENCES:
patent: 4035715 (1977-07-01), Wyman et al.
patent: 5244146 (1993-09-01), Jefferson et al.
patent: 6342997 (2002-01-01), Khadkikar et al.
Banaska John G.
Roberts Gregory
Charioui Mohamed
Keithley Instruments Inc.
Pearne & Gordon LLP
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