Output driver circuit for suppressing noise generation and integ

Details Output driver circuit for suppressing noise generation and integ Output driver circuit for suppressing noise generation and integ

1993-11-04

1998-08-18

Callahan, Timothy P.

Miscellaneous active electrical nonlinear devices, circuits, and

Gating

Accelerating switching

327170, 327389, H03K 1704

Patent

active

057962871

ABSTRACT:
An improved output driver circuit for a semiconductor integrated circuit device is provided. The output driver circuit receives a type select signal (.phi.1,/.phi.1) determined by bonding selection. When a heavy load circuit is connected to an output terminal (DQ), a signal (.phi.1) of low level and a signal (/.phi.1) of high level are provided, whereby transistors (18, 19) are turned on simultaneously in response to a data signal (Mo). When a light load circuit is connected to the terminal (DQ), a signal (.phi.1) of high level and a signal (/.phi.1) of low level are provided, whereby transistors (18, 19) are turned on at a different timing. More specifically, following charging of a light load by a transistor (18) having low mutual conductance, a transistor (19) is turned on. Therefore, noise generation can be flexibly suppressed by bonding selection.

REFERENCES:
patent: 4961010 (1990-10-01), Davis
patent: 5003205 (1991-03-01), Kohda et al.
patent: 5041738 (1991-08-01), Walters
patent: 5128555 (1992-07-01), Millman
"Dual-Regulator Dual-Decoding-Trimmer DRAM Voltage Limiter for Burn-in Test", Masashi Horiguchi et al., IEEE Journal of Solid-State Circuits, vol. 26, No. 11, Nov. 1991, pp. 1544-1549.
R.C. Foss et al., "Application of a High-Voltage Pumped Supply for Low-Power DRAM", 1992 Symposium on VLSI Circuits Digest of Technical Papers.

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