Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Calibration
Reexamination Certificate
2007-04-12
2009-02-24
Dole, Timothy J (Department: 2831)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Calibration
C324S765010
Reexamination Certificate
active
07495453
ABSTRACT:
To decrease the circuit scale necessary for the calibration of the output circuit and to decrease the time required for the calibration operation. The invention includes a first output buffer and a second output buffer that are connected to a data pin, and a calibration circuit that is connected to a calibration pin. The first output buffer and the second output buffer include plural unit buffers. The unit buffers have mutually the same circuit structures. With this arrangement, the impedances of the first output buffer and the second output buffer can be set in common, based on the calibration operation using the calibration circuit. Consequently, both the circuit scale necessary for the calibration operation and the time required for the calibration operation can be decreased.
REFERENCES:
patent: 4922135 (1990-05-01), Mollier et al.
patent: 5371457 (1994-12-01), Lipp
patent: 5517142 (1996-05-01), Jang et al.
patent: 5675824 (1997-10-01), Steele
patent: 5754480 (1998-05-01), Sato
patent: 6347580 (2002-02-01), Huang
patent: 6484293 (2002-11-01), Starr
patent: 6549036 (2003-04-01), Lee
patent: 6900691 (2005-05-01), Furue
patent: 6965529 (2005-11-01), Zumkehr et al.
patent: 7170313 (2007-01-01), Shin
patent: 7176729 (2007-02-01), Hayashi et al.
patent: 7215128 (2007-05-01), Fujisawa
patent: 2006/0097749 (2006-05-01), Ahmad et al.
patent: 07-142985 (1995-06-01), None
patent: 08-032435 (1996-02-01), None
patent: 10-224201 (1998-08-01), None
patent: 11-085345 (1999-03-01), None
patent: 2000-031811 (2000-01-01), None
patent: 2000-059202 (2000-02-01), None
patent: 2000-134084 (2000-05-01), None
patent: 2001-094409 (2001-04-01), None
patent: 2001-168704 (2001-06-01), None
patent: 2002-152032 (2002-05-01), None
patent: 2002-152032 (2002-05-01), None
patent: 2003-133943 (2003-05-01), None
patent: 2003-133943 (2003-05-01), None
patent: 2003-347923 (2003-12-01), None
patent: 2004-032070 (2004-01-01), None
patent: 2004-32070 (2004-01-01), None
patent: 2006-130217 (2006-05-01), None
Japanese Office Action, with English translation, issued in Japanese Patent Application No. JP 2005-011272, mailed Dec. 4, 2007.
Dole Timothy J
Elpida Memory Inc.
He Amy
McDermott Will & Emery LLP
LandOfFree
Output circuit for semiconductor device, semiconductor... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Output circuit for semiconductor device, semiconductor..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Output circuit for semiconductor device, semiconductor... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4059862