Output buffer circuit and semiconductor integrated circuit

Miscellaneous active electrical nonlinear devices – circuits – and – Signal converting – shaping – or generating – Current driver

Reexamination Certificate

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Details

C327S112000, C327S158000, C327S167000, C324S076770, C324S076780, C324S076790

Reexamination Certificate

active

07135896

ABSTRACT:
Replica output buffers, having the same input/output characteristic as that of an output buffer, respond to the rise of a TEST signal generated by a test pulse generating circuit and causes an output signal to rise at a through rate according to voltage of an SL_SET signal, and causes an output signal to fall at a through rate according to voltage of a CNT signal. A phase comparing circuit makes a comparison between phases of the signals output from the replica output buffers, and outputs an UP signal or Down signal with a length corresponding to a phase difference to a delay control circuit. The delay control circuit changes the voltage of the CNT signal according to the UP signal and the DOWN signal, and adjusts a through rate at which a signal output from the output buffer falls.

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patent: 2000-332595 (2000-11-01), None

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