Image analysis – Pattern recognition – Feature extraction
Reexamination Certificate
2011-06-07
2011-06-07
Rahmjoo, Mike (Department: 2624)
Image analysis
Pattern recognition
Feature extraction
C382S202000, C382S204000, C382S282000, C382S173000
Reexamination Certificate
active
07957594
ABSTRACT:
An outline definition apparatus includes an edge detection unit detecting pixels at edge positions, each of the pixels at the edge positions having a data value between a value representing a first level and a value representing a second level, a pixel extraction unit extracting the pixels at the edge positions and extracting pixels in the vicinity thereof, a boundary-line generation unit generating a boundary line indicating a boundary between a region of the first level and a region of the second level in each of the pixels at the edge positions, and a link-processing unit obtaining an outline indicating a boundary between a region of the first level and a region of the second level in the still image by linking the boundary lines which are generated in the boundary-line generation unit and which are generated for the pixels which are located at the edge positions.
REFERENCES:
patent: 7218763 (2007-05-01), Belykh et al.
patent: 8-36641 (1996-02-01), None
patent: 2004-79970 (2004-03-01), None
Kondo Tetsujiro
Yasuoka Tomohiro
Oblon, Spivak McClelland, Maier & Neustadt, L.L.P.
Rahmjoo Mike
Sony Corporation
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