Outer product optical interferometer with mask

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356353, 356345, 364827, G06E 300, G06G 719, G01B 902

Patent

active

050124404

ABSTRACT:
An outer product shearing interferometer for an optical source of one-dimensional extent which provides simultaneous interference between every two points on the source. The interferometer comprises an input plane containing the source, an output plane for observing the outer product, an imaging system between the two planes, and a mask positioned in the transform plane of the imaging system and having slits arranged to effect the desired outer product. The desired outer product results from a simultaneous application of many lateral shears instead of only one at a time.

REFERENCES:
patent: 3829219 (1974-08-01), Wyant
patent: 4089589 (1978-05-01), Brockman et al.
patent: 4118124 (1978-10-01), Matsuda
patent: 4265534 (1981-05-01), Remijan
patent: 4413909 (1983-11-01), Pohle
patent: 4556950 (1985-12-01), Tai et al.
patent: 4670646 (1987-06-01), Spivey
patent: 4707137 (1987-11-01), Lee
patent: 4711576 (1987-12-01), Ban
patent: 4758976 (1988-07-01), Cohen
Sov. J. Opt. Technol 48, Aug. 8, 1981, pp. 449-451.

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