Oscillator method and apparatus for a test chip

Details Oscillator method and apparatus for a test chip Oscillator method and apparatus for a test chip

2005-03-01

2005-03-01

Pascal, Robert (Department: 2817)

Oscillators

Ring oscillators

C331S044000

Reexamination Certificate

active

06861912

ABSTRACT:
A method and apparatus for modifying a frequency of an oscillating signal comprises generating an oscillating signal of a predetermined frequency on a semiconductor device used as an evaluation test chip by connecting a predetermine number of circuit elements in a ring oscillator configuration. A delay element operably coupled into the ring oscillator configuration modifies the predetermined frequency of the ring oscillator configuration. The operable coupling may occur on a semiconductor package containing the semiconductor device or a circuit board containing the semiconductor device. A ring oscillator is also described.

REFERENCES:
patent: 4495628 (1985-01-01), Zasio
patent: 5818250 (1998-10-01), Yeung et al.
patent: 6544807 (2003-04-01), Bach

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