Oscillators – With frequency calibration or testing
Reexamination Certificate
2002-09-06
2004-05-11
Mis, David (Department: 2817)
Oscillators
With frequency calibration or testing
C331S057000, C714S721000
Reexamination Certificate
active
06734743
ABSTRACT:
BACKGROUND OF THE INVENTION
This invention relates to the measurement of device cycle time using oscillation based sequential element characterization.
REFERENCES:
patent: 6388533 (2002-05-01), Swoboda
Bittlestone Clive
Borchers Brian D.
Counce Doug
Korson Steven P.
Sheffield Bryan
Brady III W. James
Keagy Rose Alyssa
Mis David
Telecky , Jr. Frederick J.
Texas Instruments Incorporated
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