Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Distributive type parameters
Reexamination Certificate
2007-03-13
2007-03-13
Hirshfeld, Andrew H. (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Distributive type parameters
C324S072500, C250S311000, C250S310000
Reexamination Certificate
active
11139759
ABSTRACT:
A microwave imaging microscope and associated probe, or a read head. The probe or the read head includes a sensor unit with three fixed electrodes, preferably a stimulating electrode surrounding a sensing electrode and isolated by a grounded electrode. Circuitry couples the stimulating electrode to the probe signal variably selected in the range of 100 MHz to 100 GHz and couples the sensing electrode to a signal processor detecting in-phase and out-of-phase components of the current or voltage across the sensing electrode and the grounded electrode. A mechanical positioner moves the probe vertically towards the sample and scans it across the sample. The probe may be formed by semiconductor processing methods on a silicon chip.
REFERENCES:
patent: 4481616 (1984-11-01), Matey
patent: 5065103 (1991-11-01), Slinkman et al.
patent: 5523700 (1996-06-01), Williams et al.
patent: 5744704 (1998-04-01), Hu et al.
patent: 5821410 (1998-10-01), Xiang et al.
patent: 5866904 (1999-02-01), Todokoro et al.
patent: 5900618 (1999-05-01), Anlage et al.
patent: 6320688 (2001-11-01), Westbrook et al.
patent: 6597185 (2003-07-01), Talanov et al.
patent: 6614227 (2003-09-01), Ookubo
patent: 6825645 (2004-11-01), Kelly et al.
patent: 6856140 (2005-02-01), Talanov et al.
patent: 7109735 (2006-09-01), Janik et al.
patent: 2003/0071605 (2003-04-01), Kelly et al.
patent: 2006/0176062 (2006-08-01), Yang et al.
Kelly Michael
Shen Zhi-Xun
Wang Zhengyu
Guenzer Charles S.
Natalini Jeff
Stanford University
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