Orthogonal acceleration time-of-flight mass spectrometer

Details Orthogonal acceleration time-of-flight mass spectrometer Orthogonal acceleration time-of-flight mass spectrometer

2007-06-12

2007-06-12

Wells, Nikita (Department: 2881)

Radiant energy

Ionic separation or analysis

Ion beam pulsing means with detector synchronizing means

C250S281000, C250S288000, C250S282000

Reexamination Certificate

active

11180984

ABSTRACT:
An orthogonal acceleration time-of-flight (oa-TOF) mass spectrometer has an ion source producing ions, a first region of a low degree of vacuum, an ion reservoir, and a second region of a high degree of vacuum. A space for transporting the ions produced by the ion source is placed in the first region. The ion reservoir accelerates the ions transported in from the first region in a pulsed manner and extracts the ions. A time-of-flight mass analyzer for mass separating the ions extracted from the ion reservoir is disposed in the second region, together with the ion reservoir. An isolation valve is mounted in a hole that places the first and second regions in communication with each other to permit the first and second regions to be isolated from each other.

REFERENCES:
patent: 6323482 (2001-11-01), Clemmer et al.
patent: 6828550 (2004-12-01), Griffey et al.
patent: 2001/0032930 (2001-10-01), Gillig et al.
patent: 2002/0121594 (2002-09-01), Wang et al.
patent: 2005/0023458 (2005-02-01), Satoh et al.
patent: 2004-134321 (2004-04-01), None
patent: 2004-139911 (2004-05-01), None

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