Orientation measuring instrument

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Distributive type parameters

Reissue Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C324S633000, C324S637000

Reissue Patent

active

RE040488

ABSTRACT:
It is possible to generate a resonance mode such that a dielectric resonator (20) can be resonated and an electric field vector leaking out from the resonator (20) exists by arranging antennas (22a and22b) for the resonator (20). When a sampledelete-start id="DEL-S-00001" date="20080909" ?(22)delete-end id="DEL-S-00001" ?insert-start id="INS-S-00001" date="20080909" ?(25)insert-end id="INS-S-00001" ?has dielectric anisotropy, the resonance frequency of the resonator (20) varies when the sample (25) or resonator (20) is rotated. The dielectric anisotropy of the sample (25) is found from the variance of the resonance frequency. Thus the dielectric anisotropy of not only a sheet-like sample, but also such a sample as a three-dimensional molded sample can be measured.

REFERENCES:
patent: 4500385 (1985-02-01), Heikkla
patent: 4710700 (1987-12-01), Osaki et al.
patent: 4841223 (1989-06-01), Baum et al.
patent: 4868488 (1989-09-01), Schmall
patent: 4904928 (1990-02-01), Lewis
patent: 5119034 (1992-06-01), Ishikawa et al.
patent: 5334941 (1994-08-01), King
patent: 5506497 (1996-04-01), Klein et al.
patent: 5532604 (1996-07-01), Nagata
patent: 5563505 (1996-10-01), Dorothy et al.
patent: 5699163 (1997-12-01), Todoroki et al.
patent: 6049211 (2000-04-01), Varpula et al.
patent: 6375875 (2002-04-01), Paulauskas et al.
patent: 6496018 (2002-12-01), Nagata et al.
patent: 6538454 (2003-03-01), Frenkel et al.
patent: 547968 (1993-06-01), None
patent: 0 547 968 (1993-06-01), None
patent: 0 710 917 (1995-04-01), None
patent: 1-163645 (1989-06-01), None
patent: 1-270648 (1989-10-01), None
patent: 2-29982 (1990-07-01), None
patent: 3-39632 (1991-06-01), None
patent: 3-70368 (1991-07-01), None
patent: 4-9467 (1992-02-01), None
patent: 7-14870 (1995-04-01), None
patent: 07-120515 (1995-05-01), None
patent: 7-225200 (1995-08-01), None
patent: 7-270342 (1995-10-01), None
patent: 8-122375 (1996-05-01), None
patent: 8-271449 (1996-10-01), None
patent: WO-96/11410 (1996-04-01), None
patent: WO 9701088 (1997-01-01), None
patent: WO 97/01088 (1997-01-01), None
European Search Report dated Jan. 2, 2003.
Japanese Office Action mailed Mar. 22, 2005 (3 pages).
International Search Report, Feb. 14, 2000.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Orientation measuring instrument does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Orientation measuring instrument, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Orientation measuring instrument will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3988096

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.