Coating processes – Coating by vapor – gas – or smoke
Reexamination Certificate
2008-01-28
2009-11-10
Gonzalez, Porfirio Nazario (Department: 1621)
Coating processes
Coating by vapor, gas, or smoke
C556S176000
Reexamination Certificate
active
07615250
ABSTRACT:
This invention relates to organoaluminum precursor compounds represented by the formula:wherein R1, R2, R3and R4are the same or different and each represents hydrogen or an alkyl group having from 1 to about 3 carbon atoms, and R5represents an alkyl group having from 1 to about 3 carbon atoms. This invention also relates to processes for producing the organoaluminum precursor compounds and a method for producing a film or coating from the organoaluminum precursor compounds.
REFERENCES:
patent: 5880303 (1999-03-01), Choi
patent: 6143357 (2000-11-01), Shin et al.
patent: 7348445 (2008-03-01), Peters et al.
O.T. Beachley, Jr. and K. C. Racette. “Chelation in Organoaluminum-Nitrogen Chemistry.” Inorganic Chemistry, vol. 15, No. 9, 1976. pp. 2110-2115.
O.T. Beachley, Jr. and K. C. Racette. “Preparation and Properties of a Neutral, Chelated Four-Coordinate Organoaluminum-Nitrogen Derivative.” Inorganic Chemistry, vol. 14, No. 10, 1975. pp. 2534-2537.
Jayaprakash Khanderi, et al. “Ligand Stabilised Dialkyl Aluminium Amides As New Precursors For Aluminium Nitride Thin Films”. Journal of Materials Chemistry, 2004, 14, pp. 3210-3214.
Jae E. Park, et al. “Reactions of AIR3(R=Me, Et) with H2NCH2CH2NMe2: Synthesis and Characterization of Amido- and Imidoalanes.” Organometallics 1999, 18. pp. 1059-1067.
Helfer Derrik S.
Peters David W.
Gonzalez Porfirio Nazario
Praxair Technology Inc.
Schwartz Iurie A.
LandOfFree
Organoaluminum precursor compounds does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Organoaluminum precursor compounds, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Organoaluminum precursor compounds will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4087675