Ordering shift register latches in a scan ring to facilitate dia

Details Ordering shift register latches in a scan ring to facilitate dia Ordering shift register latches in a scan ring to facilitate dia

1993-06-11

1995-01-31

Beausoliel, Jr., Robert W.

Excavating

H04B 1700

Patent

active

053864239

ABSTRACT:
In a shift register latch scan string such as that employed in level sensitive scan design (LSSD) methodologies, primary input and/or primary output signal line connections are distributed in a substantially uniform fashion along the length of the shift register scan string configuration so as to provide a mechanism for testing for fault conditions existing along the scan string.

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Stolte et al., Design For Testability of the IBM System/38, 1979, pp. 255-262 (from IEEE 1979 Test Conference).
Goel et al., Functional Tests For Purposes of Shift Register Testing, Jun. 1978, pp. 157-158 (from IBM Technical Bulletin, vol. 21 No. 1).
ASIC Technology, Oct. 1990 by P. P. Fasang "Boundary Scan Addresses Parametric Test Issues".
IEEE Transaction on Computers, J. Savir, vol. C-35 No. 1, Jan. 1986 "The Bidirectional Double Latch (BDDL)".
EDN, Apr. 1989 "Support for Scannable Design Grows in Board and ASIC Test".

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