Optoelectronic spectral analysis system

Optics: measuring and testing – By shade or color – Trichromatic examination

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

356407, 356402, G01N 2125

Patent

active

058384510

ABSTRACT:
Improved apparatus for low cost measurement of spectral intensity distribution of light energy reflected from surfaces of or transmitted through objects or materials, using solid state emitters and detectors. The measurement results remain consistent in spite of variations in component characteristics or temperature.

REFERENCES:
patent: 3994590 (1976-11-01), Di Martini et al.
patent: 4699510 (1987-10-01), Alguard
patent: 4986665 (1991-01-01), Yamanishi et al.
patent: 5137364 (1992-08-01), McCarthy
patent: 5175697 (1992-12-01), Kawagoe et al.
patent: 5229814 (1993-07-01), Taranowski et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Optoelectronic spectral analysis system does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Optoelectronic spectral analysis system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Optoelectronic spectral analysis system will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-890173

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.