Optoelectronic method and apparatus for measuring the bending an

Details Optoelectronic method and apparatus for measuring the bending an Optoelectronic method and apparatus for measuring the bending an

1983-04-29

1986-01-14

Nelms, David C.

Radiant energy

Photocells; circuits and apparatus

Optical or pre-photocell system

72 37, G01H 2186

Patent

active

045647658

ABSTRACT:
To achieve a greater accuracy, an optoelectronic measuring method and an apparatus for measuring with optoelectronic instruments provides that one or two light rays of one or two light transmitters, such as lasers, are directed at an acute angle onto a surface to be shaped and that the distance covered from the starting position to the end position in the shaping operations is measured by means of a photodetector, e.g., a diode camera, which is set up perpendicular to the light spot or spots.

REFERENCES:
patent: 3807870 (1974-04-01), Kalman
patent: 4227813 (1980-10-01), Pirlit
patent: 4298286 (1981-11-01), Maxey et al.
patent: 4309103 (1982-01-01), Bodlaj
patent: 4349274 (1982-09-01), Steele
patent: 4455085 (1984-06-01), Kato et al.

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