Optoelectronic longitudinal measurement method and...

Optics: measuring and testing – Angle measuring or angular axial alignment – Relative attitude indication along 3 axes with photodetection

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C356S139010, C356S139100

Reexamination Certificate

active

08085394

ABSTRACT:
The invention relates to an optoelectronic measurement method for determining a position, particularly an angle or a length, of a code carrier (10) that carries a position code (11) and is movable relative to a detector element (30) with a degree of freedom, particularly in a rotary or translational fashion. The detector element (30) has at least one line in the longitudinal direction comprising a plurality of light-sensitive receiving regions (31) disposed in a linear fashion. In the course of the positional measurement method, a projection is produced of part of the position code (11) on the detector element (30) that is dependent on the position of the code carrier (10); said projection is produced by at least an emission of optical radiation onto the code carrier (10) using a laser diode (20) having an emitter edge (21), and said projection is detected by the detector element (30). The position of the code carrier (10) relative to the detector element (30) is derived from the projection. According to the invention, in the projection on the detector element (30) thus produced, the axis of divergence of the laser diode emission (26) running perpendicular to the emitter edge (21) has a substantially parallel orientation to the longitudinal axis (34) of the detector element (30).

REFERENCES:
patent: 3983391 (1976-09-01), Clemons
patent: 4668862 (1987-05-01), Waibel
patent: 5317149 (1994-05-01), Uebbing et al.
patent: 6327791 (2001-12-01), Norcross et al.
patent: 6984837 (2006-01-01), Gachter et al.
patent: 7145127 (2006-12-01), Chin et al.
patent: 658 514 (1986-11-01), None
patent: 19621188 (1997-11-01), None
patent: 0 643 286 (1993-09-01), None
patent: 0 597 705 (1994-05-01), None
patent: 1111347 (2001-06-01), None
patent: 99/54683 (1999-10-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Optoelectronic longitudinal measurement method and... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Optoelectronic longitudinal measurement method and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Optoelectronic longitudinal measurement method and... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4261024

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.