Optoelectronic circuit

Details Optoelectronic circuit Optoelectronic circuit

1986-10-20

1988-06-14

Wan, Gene

Optics: measuring and testing

Of light reflection

356434, 356444, 356446, 356448, G01N 2100, G01N 2147, G01N 2155

Patent

active

047508388

ABSTRACT:
An optoelectric circuit for measuring the different optical densities of an image carrier, a toned test patch in an otherwise untoned imaging area of a photoconductor surface in a xerographic apparatus, wherein a LED (46) irradiates a test area of the surface, a phototransistor (47) receives radiation reflected from the text area, an amplifier (51) amplifies the output signal of the phototransistor, the LED is driven by the amplified output current of the phototransistor, and the current through the LED is used as a measure of the optical density.

REFERENCES:
patent: 4553033 (1985-11-01), Hubble, III et al.

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