Optoelectrical particle detection apparatus

Details Optoelectrical particle detection apparatus Optoelectrical particle detection apparatus

1991-02-21

1992-03-10

Rosenberger, Richard A.

Optics: measuring and testing

By particle light scattering

With photocell detection

359860, 359863, G01N 2147, G01N 1502

Patent

active

050945335

ABSTRACT:
An optoelectrical particle detection apparatus comprising concave and convex reflectors spaced from each other by a predetermined distance, a laser source for emitting a laser beam and introducing the laser beam between the concave and convex reflectors, the concave and convex reflectors and the laser source being arranged so that the laser beam is multi-reflected at a much closer pitch to form a laser beam curtain in which the multi-reflected beam segments are overlapped with respect to each other to enhance a light intensity thereof, and an optoelectrical detector for receiving light scattered due to a presence of particles in the laser beam curtain, whereby the presence of particles can be detected in the laser beam curtain with a high probability and a high sensitivity.

REFERENCES:
patent: 3414354 (1968-12-01), Siegler
patent: 3578867 (1971-05-01), Barrington
patent: 4739177 (1988-04-01), Borden
patent: 4825094 (1989-04-01), Borden et al.
patent: 4848905 (1989-07-01), Iino
Patent Abstracts of Japan, vol. 12, No. 23 (P-658) (2370), 1/23/88; & JP A-62177432 (Kowa Co) 8/4/87.
Patent Abstracts of Japan, vol. 6, No. 112 (P-124) (990), 6/23/82; & JP A-57042842 (Nitsutan K.K.) 3/10/82.
Patent Abstracts of Japan, vol. 11, No. 93, (P-559) (2540), 3/24/87; & JP A-61245041 (Fujitsu Ltd.) 10/31/86.

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