Opto-electronic system for determining a deviation between the a

Details Opto-electronic system for determining a deviation between the a Opto-electronic system for determining a deviation between the a

1974-02-14

1976-11-16

Hecker, Stuart N.

Telegraphy

Systems

Simplex-reversing periodic

1791003V, 250201, H04N 576, G11B 700

Patent

active

039925749

ABSTRACT:
An opto-electronic system is described for determining a deviation between the actual position of a radiation-reflecting plane in an optical imaging system and the desired position of said plane. Two auxiliary radiation sources are provided which are shifted in opposite directions relative to the optical axis of the imaging system and two radiation-sensitive detectors which are also shifted in opposite directions relative to the optical axis of the imaging system. Of the set of auxiliary radiation sources and the set of detectors the elements of one set are shifted relative to each other in the direction of the optical axis. The auxiliary radiation sources may be formed with the aid of a Fresnel zone plate.

REFERENCES:
patent: 3198880 (1965-08-01), Toulon
patent: 3381086 (1968-04-01), DeMoss et al.
patent: 3502415 (1970-03-01), Hock
patent: 3612695 (1971-10-01), Bouwhuis et al.
patent: 3635551 (1972-01-01), Szymber
patent: 3639048 (1972-02-01), Heaney et al.
patent: 3756723 (1973-09-01), Hock
patent: 3833769 (1974-09-01), Compaan et al.
patent: 3876842 (1975-04-01), Bouwhuis
Frosch et al, Optical Surface Microtopography Measurement and/or Automatic Focussing, IBM Technical Disclosure Bulletin, vol. 15, No. 2, July, 1972, pp. 504-505.

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