Opto-electronic interferometic logic

Details Opto-electronic interferometic logic Opto-electronic interferometic logic

1992-11-24

1994-10-04

Turner, Samuel A.

Optics: measuring and testing

By particle light scattering

With photocell detection

385 14, G01B 902

Patent

active

053531140

ABSTRACT:
In this invention, an optical beam is multiplexed with two independently generated electrical pulse signals applied simultaneously to an interferometer having at least two branches to perform electrical-to-optical operations, such as logic, encryption or multiplexing operations. A Y junction interferometer which is coupled to receive a CW or periodic occurring optical beam has at least one set of individually addressable contacts. A first pair of individually addressable contacts is coupled to receive a first independently generated electrical pulse signal of a given frequency and amplitude, and a second pair of individually addressable contacts coupled to the same or another branch of the Y is coupled to receive a second independently generated electrical pulse signal of a given frequency and amplitude which is other than substantially identical to and other than substantially in-phase inverse with the first signal. The output optical signal is a signal representative of optical pulses of the logic, encryption or multiplexing operation.

REFERENCES:
patent: 4763974 (1988-08-01), Thaniyavarn
patent: 4878723 (1989-11-01), Chen et al.
patent: 5034603 (1991-07-01), Wilson
patent: 5162869 (1992-11-01), Michel et al.
patent: 5185830 (1993-02-01), Nishimoto
patent: 5214726 (1993-05-01), Hockaday
patent: 5253309 (1993-10-01), Nazarathy et al.

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