Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Physical design processing
Reexamination Certificate
2009-01-13
2011-10-11
Chiang, Jack (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Integrated circuit design processing
Physical design processing
C716S108000, C716S134000
Reexamination Certificate
active
08037437
ABSTRACT:
The Global Dynamic Critical Path is used to optimize the design of a system-on-a-chip (SoC), where hardware modules are in different clock domains. Control signal transitions of the hardware modules are analyzed to identify the Global Dynamic Critical Path. Rules are provided for handling specific situations such as when concurrent input control signals are received by a hardware module. A configuration of the hardware modules is modified in successive iterations to converge at an optimum design, based on a cost function. The cost function can account for processing time as well as other metrics, such as power consumed. For example, during the iterations, hardware modules which are in the Global Dynamic Critical Path can have their clock speed increased and/or additional resources can be added, while hardware modules which are not in the Global Dynamic Critical Path can have their clock speed decreased and/or unnecessary resources can be removed.
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Budiu Mihai
Davis John D.
Kannan Hari
Aisaka Bryce
Chiang Jack
Microsoft Corporation
Vierra Magen Marcus & DeNiro LLP
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