Data processing: database and file management or data structures – Database design – Data structure types
Reexamination Certificate
2007-03-13
2007-03-13
Pardo, Thuy N. (Department: 2165)
Data processing: database and file management or data structures
Database design
Data structure types
C707S793000, C707S793000, C707S793000
Reexamination Certificate
active
10137723
ABSTRACT:
A system and method for storing measurements. Each measurement may include bulk data and attribute data. The bulk data and the attribute data may be stored using different storage mechanisms. In one embodiment, relational database technology may be used to store the attribute data. Relational database technology may facilitate querying or searching on the attribute data. The bulk data may be stored in a database specialized for storing bulk data.
REFERENCES:
patent: 5983164 (1999-11-01), Ocondi
patent: 6032159 (2000-02-01), Rivlin
patent: 6173287 (2001-01-01), Eberman et al.
patent: 6263330 (2001-07-01), Bessette
patent: 6385552 (2002-05-01), Snyder
patent: 6542841 (2003-04-01), Snyder
patent: 6741998 (2004-05-01), Ruth et al.
patent: 6934766 (2005-08-01), Russell
National Instruments, DIAdem™ DATA, ASAM Data Navigator, 2001, 3 pages.
Dipl.-Ing. Thorsten Mayer, “Technical Data Management for the Software of National Instruments”, Jan. 30, 2001, 13 pages.
DIAgraph article, Jan. 1998, 7 pages (in German).
A Stable Basis, New ASAM-conform DataCache, DIAgraph, Jan. 1998, p. 2 only (in English) (Translation of a portion of A3).
Haub Andreas Peter
Helpenstein Helmut J.
Laborde Guy Vachon
Pierce David Mark
Romainczyk Stefan
Burgess Jason L.
Hood Jeffrey C.
Meyertons Hood Kivlin Kowert & Goetzel P.C.
National Instruments Corporation
Pardo Thuy N.
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