Optimized reference voltage generation using switched...

Details Optimized reference voltage generation using switched... Optimized reference voltage generation using switched...

2005-11-22

2005-11-22

Tokar, Michael (Department: 2819)

Coded data generation or conversion

Analog to or from digital conversion

Analog to digital conversion

C341S155000, C341S161000, C341S162000, C341S163000

Reexamination Certificate

active

06967611

ABSTRACT:
An algorithmic or cyclic data converter uses an RSD stage having a switched capacitor network for efficiently scaling at least one externally supplied reference voltage. A reference voltage is scaled by using capacitor ratios that also function to provide an output voltage used as a residue output of the RSD A/D converter. The residue is used to generate a bit value corresponding to the magnitude of the residue. Two RSD stages cycle back and forth generating a logic value each half clock cycle until the desired bit resolution is achieved. In one form, the RSD stage scales the externally supplied reference voltage only by factors of less than one. In another form, the RSD stage scales the reference voltage by any scaling factor. A reference voltage scaling circuit separate from the RSD stage is avoided.

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patent: WO 03/023968 (2003-03-01), None
Related U.S. Appl. No. 10/631,450 filed Jul. 20, 2003.

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