Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate
2007-04-23
2009-02-03
Chowdhury, Tarifur (Department: 2886)
Optics: measuring and testing
By light interference
For dimensional measurement
C356S479000
Reexamination Certificate
active
07486405
ABSTRACT:
A method, apparatus and system for optimizing the magnitude of reference levels in non-invasive imaging and analysis is disclosed. Optimizing the magnitude of reference levels enables improving signal to noise ratios and thereby improving the sensitivity and performance of the imaging and analysis system. The invention includes dynamically modifying the magnitude of one or more reference beams and significantly reducing the magnitude of undesirable reference radiation components. It may further include one or more stabilizing feedback systems.
REFERENCES:
patent: 5781297 (1998-07-01), Castore
patent: 2004/0233457 (2004-11-01), Podoleanu et al.
patent: 2007/0278389 (2007-12-01), Ajgaonkar et al.
Chowdhury Tarifur
Cook Jonathon D
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