Optimized method of scanning and measuring a...

Details Optimized method of scanning and measuring a... Optimized method of scanning and measuring a...

2007-12-04

2007-12-04

Le, Brian (Department: 2624)

Image analysis

Applications

3-d or stereo imaging analysis

C358S493000, C345S419000

Reexamination Certificate

active

10908115

ABSTRACT:
According to the claimed invention, a method of scanning and measuring surfaces of a three-dimensional object is disclosed. The method includes (a) scanning the object from one or more different angles with a scanning device; (b) identifying unscanned surfaces of the object that have not yet been scanned by the scanning device; (c) estimating surface areas of the unscanned surfaces; (d) comparing the surface areas of the unscanned surfaces for selecting an unscanned surface having the largest surface area; (e) rotating the object with respect to the scanning device such that the scanning device is pointing towards the unscanned surface with the largest surface area; (f) scanning the object with the scanning device for scanning the unscanned surface with the largest surface area; and (g) repeating steps (b) to (f) until all required surfaces of the object have been scanned.

REFERENCES:
patent: 5104227 (1992-04-01), Uesugi et al.
patent: 7020325 (2006-03-01), Park
patent: 2003/0068079 (2003-04-01), Park
patent: 2004/0222987 (2004-11-01), Chang et al.
patent: 2005/0180623 (2005-08-01), Mueller et al.

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