Optically triggered transferred-electron device microwave burst

Oscillators – With device responsive to external physical condition – Temperature or light responsive

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331107G, 332 751, 357 3, 357 30, H03B 912, H03B 1700, H01L 3102

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044814852

ABSTRACT:
Transferred-electron device (TED) microwave burst and single pulse generators which are triggered by picosecond optical pulses. The burst generator includes a TED having a cathode, an anode, and a gate electrode positioned therebetween, all located on a semiconductor substrate. An optical pulse applied to the substrate between the gate and anode electrodes causes a plurality of space charge domains to sequentially travel from the gate to the illuminated region thereby causing an oscillatory burst of current to occur in the external leads of the TED. The frequency of the burst is proportional to the distance between the gate and the illuminated region and the burst duration is proportional to the optical pulse amplitude and/or duration. Alternatively, the burst generators may be formed from a two terminal TED with the cathode electrode being treated as the gate. A single pulse generator may be formed by applying an optical pulse to the substrate between the cathode and the gate of a three terminal TED. The duration of the single pulse is proportional to the distance between the gate and the anode.

REFERENCES:
patent: 3800246 (1974-03-01), Bosch et al.
patent: 3991328 (1976-11-01), Upadhyayula
Esposito, R. M. et al., "Oscillator" IBM Technical Disclosure Bulletin, v. 2, n. 11, p. 1755 (Apr. 70).
Kimura, T. et al., "Optical Triggering of Gunn-Effect Device" Electronics and Communications in Japan, v. 55-C, n. 10, pp. 86-92, (Oct. 72).
Carruthers, T. F. et al., "Oscillation Burst Generation in Transferred-Electron Devices With Picosecond Optical Pulses" Applied Physics Letters, v. 38 n. 4 pp. 202-204 (Feb. 15, 1981).
Carruthers, T. F. et al., "Transient Responses of Transferred-Electron Devices to Picosecond Optical Pulses" (Abstract) Bulletin of the American Physical Society, v. 22, n. 3, p. 457 (Mar. 81).
Carruthers, T. F. et al., "Measurement of Fluctuations Affecting Domain Formation in Transferred-Electron Logic Devices Using Picosecond Optical Pulses" Applied Physics Letters, v. 40, n. 2, pp. 150-152 (Jan. 15, 1982).

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