Optics: measuring and testing – By light interference – Having polarization
Reexamination Certificate
2005-02-15
2005-02-15
Niebling, John F. (Department: 2812)
Optics: measuring and testing
By light interference
Having polarization
Reexamination Certificate
active
06856403
ABSTRACT:
An apparatus and method for performing quality inspections on a test surface based on optically stimulated emission of electrons. In one embodiment, the apparatus comprises a device for producing optical radiation having a plurality of different spectrum lines, selecting at least one of the spectrum lines, and directing the selected spectrum line to the test surface, and circuitry for detecting a current of photoelectrons emitted from the test surface, generating a signal indicative of photoelectron current, and for indicating a condition of quality based on the generated signal indicative of the photoelectron current. In one embodiment, the method comprises producing optical radiation having a plurality of different spectrum lines, selecting at least one of the spectrum lines and directing the selected spectrum line to the test surface, detecting a current of photoelectrons emitted from the test surface and generating a signal indicative of photoelectron current, and indicating a condition of quality based on the generated signal indicative of the photoelectron current.
REFERENCES:
patent: 5393980 (1995-02-01), Yost et al.
patent: 6480285 (2002-11-01), Hill
Perey Daniel F.
Welch Christopher S.
Galus Helen M.
Niebling John F.
Stevenson Andre′ C.
The United States of America as represented by the Administrator
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