Optically phased-locked speckle pattern interferometer

Details Optically phased-locked speckle pattern interferometer Optically phased-locked speckle pattern interferometer

1988-01-29

1990-04-03

McGraw, Vincent P.

Optics: measuring and testing

By particle light scattering

With photocell detection

356360, 73656, G01B 902

Patent

active

049135473

ABSTRACT:
An optically phase-locked electronic speckle pattern interferometer mixes a local oscillator beam with a beam reflected from a target surface to create a speckle pattern at each of two separate image planes. The speckle pattern includes speckles whose intensities vary as a result of time-varying Doppler shifting of the reflected beam by movement or deformation of the target surface. The local oscillator beam is phase-locked to the Doppler signature of a lock-point speckle on one image plane. The phase-locking of the local oscillator beam to Doppler information of interest enables the interferometer to coherently detect speckle in the image plane sharing frequency, amplitude, and phase characteristics with the lock-point speckle, which supports the efficient processing of images obtained from the other image plane. The processing produces a contoured image of the target surface, with demarcation between coherently and non-coherently detected speckle.

REFERENCES:
patent: 3622794 (1971-11-01), Pond et al.
patent: 3649754 (1972-03-01), Macovski
patent: 3816649 (1974-06-01), Butters et al.
patent: 3828126 (1974-08-01), Ramsey
patent: 4018531 (1977-04-01), Leendertz
patent: 4191476 (1980-03-01), Pollard
Optically Phase-Locked Electronic Speckle Pattern Interferometer, Steve. E. Moran, Robert L. Law, Peter N. Craig, and Warren M. Goldberg; 02/01/87.

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