Optically balanced instrument for high accuracy measurement...

Details Optically balanced instrument for high accuracy measurement... Optically balanced instrument for high accuracy measurement...

2006-01-23

2008-09-16

Lee, Hwa (Andrew) S (Department: 2886)

Optics: measuring and testing

By light interference

For dimensional measurement

Reexamination Certificate

active

07426039

ABSTRACT:
An instrument for measuring dimensional changes in materials, such as ultra-low thermal expansion materials, contains an optically balanced measuring loop. Both an object beam and a loop beam propagate around the measuring loop. The object beam encounters both opposite side surfaces of the test object and the loop beam encounters remaining components of the measuring loop in common with the object beam. The object and loop beams can be separately compared to reference beams for producing heterodyne signal beams.

REFERENCES:
patent: 6504615 (2003-01-01), Abe et al.
patent: 7173715 (2007-02-01), Mueller et al.
patent: 7239397 (2007-07-01), Badami et al.
M. Okaji, N. Yamada, K. Nara, and H. Kato entitled “Laser interferometric dilatometer at low temperatures: application to fused silica SRM 739,” Cryogenics 35, pp. 887-891, 1995.

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