Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1995-09-18
1996-11-19
Turner, Samuel A.
Optics: measuring and testing
By particle light scattering
With photocell detection
356358, G01B 902
Patent
active
055768342
ABSTRACT:
A wavemeter apparatus for a precise determination of a wavelength of a target light beam and its measuring error is presented. The apparatus is an interferometer type apparatus which computes fractional part of the interference fringes. The apparatus includes a beam splitter (1) to divide the target light beam into two beams which are injected into a fixed mirror (2) and a moving mirror (3) and the reflected beams are inputted into a photoreceiver (4) to generate interference fringes. The photoreceiver (4) generates a first pulse signal (21) for every fringe spacing given by .lambda./2 and the distance measuring device (5) generates a second pulse signal (22) for each distance d travelled by the moving mirror given by a resolution capability of the distance measuring device (5). A computation section (6) computes count values M and N(M), for the first pulse signals (21) and the second pulse signals (22), respectively. The fractional part of the count .epsilon.M is computed by using a relation M.lambda./2=d(N(M)+.epsilon.M) and an estimated wavelength .lambda.M is computed from a relation .lambda.M=2dN(M)/M based on the values of M.multidot.N(M). The display section (7) displays the value of .lambda.M, and the computation section (6) stores the count value N(M) corresponding to each value M of the interference fringes. The final closest estimated value of the target light beam is derived by numerical computation from the count N(M).
REFERENCES:
patent: 5133598 (1992-07-01), Badeau
patent: 5164788 (1992-11-01), Yoshikawa
patent: 5247342 (1993-09-01), Tamura et al.
patent: 5486918 (1996-01-01), Nagashima
Ando Electric Co. Ltd.
Kim Robert
Turner Samuel A.
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