Optical wavelength monitor using blazed diffraction grating

Details Optical wavelength monitor using blazed diffraction grating Optical wavelength monitor using blazed diffraction grating

1986-09-25

1988-07-19

McGraw, Vincent P.

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

350320, 372 32, G01B 902, G01C 1964, H01S 310

Patent

active

047580909

ABSTRACT:
A wavelength monitor (25) uses a diffraction grating (35) and a beam splitter (31). Light from a superluminescent diode (SLD) is supplied to the beam splitter (31) and is projected onto the grating (35).
The grating is formed by holographically projecting a diffraction pattern onto a polished surface which is then photoetched, thereby creating a blazed diffraction grating corresponding to the projected pattern. The etched grating is used as a master, wherein the etched grating is coated with reflective material. The reflective material is then transferred to a prepared substrate that has an ultra-low thermal expansion coefficient to form a low cost replica diffraction grating. The grating (35) formed in this manner becomes a very stable and efficient dispersive element that forms a spectrum of the SLD output that is free of ghost images and accurately deproduces the spectral distribution. A pair of optical sensors (41, 42) detect an imbalance in reflected light, providing an indication of wavelength deviation.

REFERENCES:
patent: 4227769 (1980-10-01), Phillips et al.
patent: 4299490 (1981-11-01), Cahill et al.
patent: 4330175 (1982-05-01), Fujii et al.
patent: 4485475 (1984-11-01), Large et al.

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