Optical wavelength meter with an up-down counter which measures

Details Optical wavelength meter with an up-down counter which measures Optical wavelength meter with an up-down counter which measures

1995-02-16

1996-01-23

Turner, Samuel A.

Optics: measuring and testing

By particle light scattering

With photocell detection

356358, 356356, 250237G, G01B 902

Patent

active

054869188

ABSTRACT:
The purpose of the present invention is to provide a highly accurate optical wavelength meter in which the accurate starting and stop points of the measurement are detected. In accordance with the present invention, a detector which detects the back-shift of the moving mirror due to elastic force of the belt and an up-down counter which measures the amounts of the overshoot and the back-shift of the moving mirror so as to cancel the overshoot and the back-shift are provided, by which the accurate starting and stop points of the measurement can be detected.

REFERENCES:
patent: 5123742 (1992-06-01), Takizawa et al.
patent: 5270790 (1993-12-01), Matsumura

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