Optical wavelength meter

Details Optical wavelength meter Optical wavelength meter

1977-04-27

1979-10-30

Corbin, John K.

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

356346, G01B 902, G01J 326

Patent

active

041726634

ABSTRACT:
In an optical wavelength meter, the wavelength of light to be measured, such as that obtained from a CW or pulsed laser, is directed through a tunable grating monochromator, serving as a bandpass filter, for passing light within the selected bandpass and determining, to the lowest degree of resolution, the wavelength of the light to be measured. Thence, the light is directed sequentially through a plurality of Fabry-Perot etalon interferometers of increasing degree of resolution. The interference patterns are sequentially directed onto a spatial detector. The radii of the first and second rings of the respective interference patterns are measured to derive fractional fringe order measurements of successively higher resolution, such that the wavelength of the light to be measured is determined in successively increasing steps of higher resolution. In a typical example, utilizing three Fabry-Perot etalons the wavelength of the light to be measured at, for example, 6328 angstroms is determined to be an absolute accuracy of .+-.200 megahertz.

REFERENCES:
patent: 4084907 (1978-04-01), Pinard et al.
Meissner; K. W., "Interference Spectroscopy", Jr. Optical Soc. America, 6-1941, pp. 405-427.

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