Image analysis – Pattern recognition – Template matching
Reexamination Certificate
2011-08-16
2011-08-16
Chang, Jon (Department: 2624)
Image analysis
Pattern recognition
Template matching
C382S218000, C382S278000
Reexamination Certificate
active
08000537
ABSTRACT:
Provided are an optical vision chip (OVC) and an image recognition method using the OVC. The OVC includes: a first display displaying an object image; a second display displaying a standard model image; and an optical sensor optically or electrically coupling the object image and the standard model image respectively displayed on the first and second displays and outputting a difference between the object image and the standard model image as an electrical signal.
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Oh Kwang Ryong
Park Sahng-gi
Yu Won Pil
Chang Jon
Electronics and Telecommunications Research Institute
Rabin & Berdo P.C.
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