Optical trapping with a semiconductor

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Reexamination Certificate

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C250S495100, C250S358100, C250S362000, C250S363010, C250S492100, C250S50400H, C359S299000, C359S350000, C359S355000, C359S356000, C356S036000, C356S051000, C356S624000, C204S478000

Reexamination Certificate

active

07745788

ABSTRACT:
A method and apparatus are disclosed for forming an optical trap with light directed through or above a semiconductor material. A preferred embodiment selected light-trapping wavelengths that have lower absorption by the semiconductor. A preferred embodiment provides for an optical trapping through semiconductor employing a thin silicon (Si) wafer as a substrate. Further embodiments of the invention provide for microchannel fabrication, force probe measurement, sorting, switching and other active manipulation and assembly using an optical trap.

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