Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1998-04-17
2000-05-30
Hantis, K. P.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
G01J 328
Patent
active
060696974
ABSTRACT:
A processing unit reads out, from a memory, wavelength setting data corresponding to wavelength information from a key input section, and outputs a wavelength setting command corresponding to the wavelength setting data to a tunable-wavelength control section and a spectral wavelength control section. The tunable-wavelength control section controls a tunable-wavelength light source section to output a laser beam having a wavelength corresponding to the wavelength setting data. The spectral wavelength control section controls a spectroscope section to perform spectroscopy of the light having the wavelength corresponding to the wavelength setting data and output the resultant light. Output light from the tunable-wavelength light source section whose wavelength has been set is input to an object to be measured. Light passing through the object is input to the spectroscope section. The spectroscope section performs spectroscopy of only the light having the wavelength corresponding to the wavelength setting data. A light-receiving section receives the spectral light and photoelectrically converts it. The resultant light is converted into digital data by an A/D conversion section to be input as level data to a processing unit. The processing unit obtains a light-reception level on the basis of the digital level data.
REFERENCES:
patent: 4957366 (1990-09-01), Koshi et al.
patent: 5796096 (1998-08-01), Rakuljic et al.
patent: 5828061 (1998-10-01), Kakimoto
Patent Abstracts of Japan, vol. 9, No. 210, (P-383), Aug. 28, 1985, ie,Jp 60 070335 A (Nippon Denshin Denwa Kosha;others: 01) Apr. 22, 1985 *abstract* only.
Endo Hiroaki
Ishiwata Muneo
Nagashima Yasuaki
Ohtateme Hiroaki
Tanimoto Takao
Anritsu Corporation
Hantis K. P.
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