Optics: measuring and testing – By light interference – Using fiber or waveguide interferometer
Reexamination Certificate
2007-03-07
2009-08-18
Lyons, Michael A (Department: 2877)
Optics: measuring and testing
By light interference
Using fiber or waveguide interferometer
C356S495000
Reexamination Certificate
active
07576866
ABSTRACT:
In an optical tomography system, an interference light obtained by multiplexing the reflected light from the object and the reference light is guided to an interference light detecting means by a waveguide means. The interference light detecting means has a spectrometer spectrally dividing the interference light. A polarization setting means which causes the interference light guided by the waveguide means to enter the spectrometer after setting the state of polarization of the interference light guided by the waveguide means to a predetermined state of polarization is provided between the waveguide means and the spectrometer.
REFERENCES:
patent: 7042573 (2006-05-01), Froggatt
patent: 2006/0055936 (2006-03-01), Yun et al.
patent: 2007/0035743 (2007-02-01), Vakoc et al.
patent: 2000-46729 (2000-02-01), None
Mitsuo Takeda, “Optical Frequency Scanning Interference Microscopes”, Optical Engineering Contact, vol. 41, No. 7 , 2003 , pp. 426-432, Partial English Translation.
FUJIFILM Corporation
Lyons Michael A
Sughrue & Mion, PLLC
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