Optical time domain reflectometry

Details Optical time domain reflectometry Optical time domain reflectometry

2007-12-04

2007-12-04

Nguyen, Tu T (Department: 2886)

Optics: measuring and testing

For optical fiber or waveguide inspection

Reexamination Certificate

active

10502616

ABSTRACT:
An optical time domain reflectometry apparatus for sensing a parameter in a region of interest is characterized in that the optical fiber includes a first section into which optical radiation at the probe wavelength is launched and a second section deployed in the region of interest. The first section has a higher intensity threshold for the onset of non-linear effects than the second section. The source launches the optical radiation into the first section at an intensity lower than the non-linear effects intensity threshold of the first section but higher than the non-linear effects intensity threshold of the second section. The attenuation characteristics of the first section are chosen such that the intensity of the optical radiation at the probe wavelength that reaches the second section is below the threshold for the onset of non-linear effects of the second section.

REFERENCES:
patent: 5991479 (1999-11-01), Kleinerman
patent: 6526208 (2003-02-01), King et al.

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