Optical test pattern for correcting convergence defects of a col

Details Optical test pattern for correcting convergence defects of a col Optical test pattern for correcting convergence defects of a col

1983-05-10

1986-12-09

Masinick, Michael A.

Facsimile and static presentation processing

Static presentation processing

Attribute control

358139, 358 93, H04N 1700

Patent

active

046283420

ABSTRACT:
An optical test pattern for correcting convergence defects of a color camera comprises LN pattern elements (1.sub.ln) each disposed within one of the LN rectangles which result from a camera-screen lattice arrangement formed by L groups each consisting of M lines and by N columns, each pattern element being constituted by a vertical component and a diagonal component.

REFERENCES:
patent: 2855515 (1958-10-01), Bernard

Affiliated with

Also associated with

Rating

Optical test pattern for correcting convergence defects of a col does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Optical test pattern for correcting convergence defects of a col, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Optical test pattern for correcting convergence defects of a col will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1387923