Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent
1980-12-03
1983-09-06
Punter, William H.
Optics: measuring and testing
By alignment in lateral direction
With light detector
356355, 356363, G01B 1127
Patent
active
044026102
ABSTRACT:
Optical system for the automatic alignment of two motifs in which the alignment marks of a first fixed motif forming the reference are constituted by at least one pair of identical periodic optical gratings with a constant spacing P and having a predetermined distance d.sub.X from one another such that the equation d.sub.X =(n+.epsilon.) P is proved, n being an integer and .epsilon. a fraction of unity.
An optical modulator, for example electro-optical means incorporating a Pockels cell alternately illuminate with the timing of the high frequency control signals, the said gratings in windows, whose position can be regulated in accordance with a given axis. The image of these windows is projected onto gratings carried on a second moving support to be aligned and produces orders of diffraction. An optoelectronic detector detects a predetermined order of diffraction. The high frequency-modulated output signals are transmitted to control circuits for producing the automatic alignment.
REFERENCES:
patent: 3541338 (1970-11-01), Duda et al.
patent: 3861798 (1975-01-01), Kobayashi et al.
patent: 4153371 (1979-05-01), Koizumi et al.
patent: 4172664 (1979-10-01), Charsky et al.
patent: 4200395 (1980-04-01), Smith et al.
G. Bouwhuis et al.: "Automatic Alignment System for Optical Projection Printing," pp. 723 to 728, IEEE Transactions on Electronic Devices, vol. ED-26, No. 4, 1979 New York (US).
"Thomson-CSF"
Punter William H.
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