Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1985-06-14
1987-09-01
Evans, F. L.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
356332, 356334, G01J 318
Patent
active
046905596
ABSTRACT:
The invention relates to an optical system for spectral analysis devices particularly for use in atomic emission spectroscopy in which the aberrations, astigmatis and coma are compensated separately, comprising two concave spherical reflectors adjacently arranged and having their vertices equidistantly located relative to a center of a dispersing member. The latter has a dispersion plane at right angles to the dispersing structure of the dispersing member and to its surface, the vertices are located in said dispersion plane. The center beams originating from an excitation light source are reflected at the reflectors in reflection planes which are at right angles to the dispersion plane. The light entrance of the optical system comprises two slits the images of which coincide in a focal plane. The center of the focal plane and the light entrance have a same distance to the dispersion plane and are located on different sides of the latter.
REFERENCES:
patent: 3658423 (1972-04-01), Elliott
patent: 4049353 (1977-09-01), Missio
patent: 4068954 (1978-01-01), Da Silva
Salmon et al., Anal. Chem., v. 50, No. 12, Oct. 1978, p. 1714.
Bausch & Lomb Echelle Spectrograph brochure, Aug. 19, 1955.
Becker-Ross Helmut
Dobschal Hans-Jurgen
Florek Stefan
Mohr Joachim
Evans F. L.
Jenoptik Jena GmbH
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