Optical system for in-plane strain measurement using electronics

Details Optical system for in-plane strain measurement using electronics Optical system for in-plane strain measurement using electronics

1986-12-01

1988-08-23

Myracle, Jerry W.

Measuring and testing

Specimen stress or strain, or testing by stress or strain...

By loading of specimen

356 32, G01L 124

Patent

active

047651890

ABSTRACT:
Electronic speckle pattern interferometric apparatus for the measurement of the displacement of a surface under test comprises a source (10) of coherent radiation, a first curved reflecting surface (11) to reflect radiation from the source on having a curvature of opposite sign from the first curved reflecting surface, and an electro-optic combining device such as a television camera (15) to receive the radiation from the surface under test.

REFERENCES:
patent: 3879988 (1975-04-01), Jacobs
patent: 4255049 (1981-03-01), Sahm et al.

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