Measuring and testing – Sheet – woven fabric or fiber
Reexamination Certificate
2006-05-02
2006-05-02
Lefkowitz, Edward (Department: 2855)
Measuring and testing
Sheet, woven fabric or fiber
C073S800000, C073S849000
Reexamination Certificate
active
07036364
ABSTRACT:
A optical system and method of measuring a strain on a surface of a band of a sheet of a material. A single line, or an area having a boundary line, is marked on the band before deformation. The line traverses a width of the band at angle. The band is deformed and an equivalent two-dimensional image of the line after deformation is obtained. The line before deformation is compared with the two-dimensional equivalent image of the line after deformation, and the strain on the surface of the band after deformation is determined.
REFERENCES:
patent: 4186610 (1980-02-01), Dolezal et al.
patent: 4591996 (1986-05-01), Vachon
patent: 4969106 (1990-11-01), Vogel et al.
patent: 5726907 (1998-03-01), Davidson et al.
patent: 5920383 (1999-07-01), Chen et al.
Zhang, et al. A Study on Fundamental Mechanisms of Warp and Recoil in Hemming; Transaction of the ASME; vol. 123; Oct. 2001; pp. 436-441.
E.G. Thomsen; A New Approach to Metal-Forming Problems, Experimental Stress Analysis for a Tubular Extrusion; Trans. ASME, vol. 77, 1955; pp. 515-522.
R. Sowerby, E. Chu, and J.L. Duncan; Determination of Large Strains in Metalforming; J. Strain Analysis, 1982, vol. 17(2); pp. 95-101.
Y. Morimoto et al., Application of Moire Analysis of Strain Using Fourier Transform; Opt. Eng., vol. 27 (8), 1988, pp. 650-656.
H.S. Rice and R.M Knight; Technical Calculus and Analysis (McGraw-Hill Book Company, Inc. New York, 1959, p. 230).
Z. Marciniak, J.L. Duncan, and S.J. Hu; Mechanics of Sheet Metal Forming; 2ndEdition, Butterworth-Heinemann, 2002, p. 3.
S. Wolfram; Mathematica Handbook; 4thEdition, Mathematica vol. 4.2 WolframResearch Inc., Chap. 3.8.1.
Hu Shixin Jack
Iyer Kaushik Arjunan
Swillo Slawomir J.
Martir Lilybett
The Regents of the University of Michigan
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