Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Chemical analysis
Reexamination Certificate
2007-10-26
2010-11-23
Wachsman, Hal D (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Chemical analysis
C250S22300B, C250S338100, C250S339060, C382S142000, C073S061430
Reexamination Certificate
active
07840360
ABSTRACT:
A system and method for non-invasively inspecting one or more vessels capable of transmitting IR light containing liquid is provided, which uses a near-infrared (NIR) imaging device in combination with one or two NIR light sources, a diffuser plate, and an optical wavelength selecting means is provided for selecting one or more wavelength bands. In addition, the system may further comprise a computer processing means, a computer database containing known absorbance values, and a computer application, such that the system may compare the collected spectroscopic data to known spectroscopic data, and identify the liquid contained within the inspected vessel. The inspection method of the present invention measures a transmission or reflection image of one or more vessels being inspected at one or more narrow wavelength intervals in the NIR spectral range that corresponds to a peak absorbance wavelength of water, organic liquids, and explosive compositions.
REFERENCES:
patent: 5536935 (1996-07-01), Klotzsch et al.
patent: 5754297 (1998-05-01), Nulman
patent: 6545278 (2003-04-01), Mottier et al.
patent: 6661909 (2003-12-01), Youvan et al.
patent: 6753527 (2004-06-01), Yamagishi et al.
patent: 7033070 (2006-04-01), Azami
patent: 7255835 (2007-08-01), Franzen et al.
patent: 2004/0159789 (2004-08-01), Treado et al.
patent: 2005/0012928 (2005-01-01), Sezginer et al.
patent: 2006/0197947 (2006-09-01), Wang et al.
International Search Report in corresponding International Appl. No. PCT/US07/22656.
Carpenter Karen K.
Micheels Ronald H.
Shashidhar Ranganathan
Suglo Janet L
Townsend & Banta
Wachsman Hal D
LandOfFree
Optical system and method for inspection and... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Optical system and method for inspection and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Optical system and method for inspection and... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4250097