Optical substrate for enhanced detectability of fluorescence

Details Optical substrate for enhanced detectability of fluorescence Optical substrate for enhanced detectability of fluorescence

2007-06-05

2007-06-05

Nguyen, Sang M. (Department: 2877)

Optics: measuring and testing

Sample, specimen, or standard holder or support

C356S630000, C250S458100, C359S884000

Reexamination Certificate

active

10858792

ABSTRACT:
A sample substrate adapted for use with fluorescence excitation light with a first wavelength. A reflector is disposed on a base. The reflector includes a reflecting multilayer interference coating with at least two layers. Not all of the layers L fulfill a quarterwave condition: dL·nL=(2N+1)·1/4 wherein dL is a physical thickness of layer L, nL is an index of refraction of layer L at the first wavelength, N is an integer equal to or greater than zero and 1 is the first wavelength. Thicknesses of the layers ensure that any fluorescent sample material disposed on top of said multilayer interference coating would be located near an antinode of a standing wave formed by the excitation light with the first wavelength incident on said substrate.

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