Optics: measuring and testing – Material strain analysis – By light interference detector
Patent
1982-02-16
1984-03-13
Sikes, William L.
Optics: measuring and testing
Material strain analysis
By light interference detector
356349, 356356, G01B 902
Patent
active
044364199
ABSTRACT:
A noncontact optical strain gauge may be used for high temperature objects and objects having a small radius of curvature in the area of interest. The gauge works by means of interferometry applied to the speckle patterns of radiation reflected from two points on the object surface.
REFERENCES:
patent: 3914056 (1975-10-01), Mottier et al.
Dandliker et al. "High Resolutin Hologram Interferometry by Electronic Phase Measurement", Optics Communications, vol. 9. No. 4, pp. 412-416 12/73.
Dandliker et al., "Quantitative Determination of Bending and Torsion . . . ", The Engineering Uses of Coherent Optics, Cambridge U. Press, pp. 99-117, 1976.
Ineichen et al., "Accuracy and Reproducibility of Heterodyne Hobgraphic Interferometry", Appl. of Holography & Opt. D. P., Jerusalem, Israel, pp. 207-212, 8/76.
Yamaguchi, "A Laser-Speckle Strain Gauge", J. Phys. E. Sci-Instru. vol. 14, No. 11, pp. 1270-1273, 11/81.
Harrison Irene R.
Stetson Karl A.
Koren Matthew W.
Petraske Eric W.
Sikes William L.
United Technologies Corporation
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